MAC Reference Standards for X-ray Microanalysis MAC X-ray Microanalysis for TEM Compound, Pure Metal, NBS, and BAS Standards MAC Reference Materials for Auger Electron Microscopy MAC Standards for X-ray Fluorescence Spectroscopy SEM Performance Standards Repolishing...
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Low Magnification Calibration Standards for SEM and LM SEM Calibration Specimens Resolution and Gray Level Test Specimens Back-Scattered Electron and EDS Calibration Specimens for TEM and STEM MAG*I*CAL® Diffraction Standards Measuring Aids Tip Check and Nioprobe for...
DuraSiN™ Film and Mesh for TEM Pyrolytic GraphiteFor more information, please feel free to contact us. Back to Products > Consumables
Gilder – a reliable support specimen grid source Veco – the most rigid grids available Maxtaform – smooth edges, firm support, and a large open area Index – Alpha Numeric and Asbestos Index Grids Synaptek ™ unflexiable grids, made of...
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