ALVTechnologies Philippines Incorporated together with our manufacturer from Asylum Research Oxford Instruments, would like to invite you to join our webinar on the topic of The Future of Quantitative PFM on January 26, 2023 at 12:00 – 1:00 AM (Philippine Time).
Piezoresponse Force Microscopy (PFM) is one of the most powerful techniques for nanoscale characterization of piezoelectric and ferroelectric materials. Despite many advances over the last 30 years, however, it has remained challenging to make reproducible, quantitative PFM measurements and sometimes even verify if the measured response is genuine. The introduction of the Interferometric Displacement Sensor (IDS) option for Asylum Research Cypher AFMs now solves many of these challenges by eliminating electrostatic cantilever-sample artifacts and other artifacts introduced by conventional optical lever (“beam bounce”) cantilever deflection detection.
In this webinar the speakers will:
- Briefly review PFM and current challenges
- Detail the origin of common artifacts that limit PFM reproducibility
- Explain why interferometric detection on the Cypher IDS can eliminate these artifacts
- Review published examples where the Cypher IDS is used to measure piezoelectric response (d33 measurements) more reproducibly
- Review published examples where the Cypher IDS is used to characterize ferroelectric materials more confidently