ALVTechnologies Philippines Incorporated together with our manufacturer from Asylum Research Oxford Instruments, would like to invite you to join our webinar on the topic of Semiconductor Dielectric Material Preparation and Characterization on January 5, 2023 at 10:00 – 11:00 AM (Philippine Time).
The Atomic Force Microscope (AFM) is a probe-based characterization instrument that can provide information about the morphology, mechanical and electrical properties of samples. Jupiter XR large-sample AFM can accommodate samples ≤ 200 mm in diameter, providing high resolution, high quality data, at high imaging speeds.
For electrical measurements, the nanoscale time-dependent dielectric breakdown (nanoTDDB) accessory has been used to evaluate the properties of HfO₂ films prepared by ALD. The webinar will cover how the Asylum’s nanoTDDB enables advanced measurements in the fields of semiconductors, 2D materials, thin films and polymers.