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ALVTechnologies Philippines Incorporated together with our manufacturer from Asylum Research Oxford Instruments, would like to invite you to join our Asylum Research Show and Tell Series on the topic of “Measuring the Surface Roughness of Thin Films and Substrates with AFM”. This webinar will be held on September 29, 2021 (Wednesday) at 10:30 AM – 11:30 AM (Philippines).

Surface roughness is an important measurement for thin films and substrates in a wide range of applications including semiconductor electronics, data storage, optics and other glass components, as well as thin films and coatings from paper to food packaging.

This webinar will introduce Atomic Force Microscopy (AFM) as a powerful measurement tool for the measurement of roughness from the scale of angstroms up to tens or hundreds of nanometers. The latest AFMs from Asylum Research can make these measurements faster, easier, and with greater precision than the previous generation AFMs that are still commonly used.


To register visit:

We hope to see you online!