The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research and industrial R&D laboratories.

  • Higher resolution than any other large-sample AFM

  • Extended range 100 μm scanner is 5-20× faster than most other AFMs

  • From setup to results, every step is simpler and faster

  • Modular design adapts to your needs for maximum flexibility

Highest Performance

  • Higher resolution than any other large-sample AFM
  • Extended-range scanner is 5-20× faster than most AFMs and features large 100 μm X-Y & 12 μm Z range
  • Exclusive blueDrive™ Tapping Mode gives more reproducible results and simplifies operation

Simpler User Experience

  • Fully-motorized laser and detector setup eliminates manual adjustment of knobs
  • Fully-addressable, high-speed stage rapidly reaches any point on 200 mm samples
  • Sharp top-view optics help you easily locate your precise region of interest
  • Go from atoms to large 100-μm scans and use any imaging mode, all with the single XR scanner

Versatility for Diverse Research Needs

  • Support for a full range of imaging modes
  • Modular design makes it fast and simple to add accessories and future upgrades
  • Flexible software makes routine measurements easy while enabling advanced research

Support that goes above and beyond your expectations

  • Includes a standard one-year comprehensive warranty
  • No-charge technical support and basic applications support for life
  • Affordable support agreements that offer extended warranties and advanced training