The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research and industrial R&D laboratories.
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Higher resolution than any other large-sample AFM
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Extended range 100 μm scanner is 5-20× faster than most other AFMs
- From setup to results, every step is simpler and faster
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Modular design adapts to your needs for maximum flexibility
Highest Performance
- Higher resolution than any other large-sample AFM
- Extended-range scanner is 5-20× faster than most AFMs and features large 100 μm X-Y & 12 μm Z range
- Exclusive blueDrive™ Tapping Mode gives more reproducible results and simplifies operation
Simpler User Experience
- Fully-motorized laser and detector setup eliminates manual adjustment of knobs
- Fully-addressable, high-speed stage rapidly reaches any point on 200 mm samples
- Sharp top-view optics help you easily locate your precise region of interest
- Go from atoms to large 100-μm scans and use any imaging mode, all with the single XR scanner
Versatility for Diverse Research Needs
- Support for a full range of imaging modes
- Modular design makes it fast and simple to add accessories and future upgrades
- Flexible software makes routine measurements easy while enabling advanced research
Support that goes above and beyond your expectations
- Includes a standard one-year comprehensive warranty
- No-charge technical support and basic applications support for life
- Affordable support agreements that offer extended warranties and advanced training
For more information, visit the Jupiter XR AFM at the Oxford Instruments Asylum Research website.